
v1.4 [Jun 21, 2012]
- Support for common VNA Master field mode and S parameter measurements as shown in the table below
- Separating multi-trace displays into multiple individual traces
- Enhancements to trace overlay capabilities
- Traces of different frequency range can overlay
- Traces of different amplitude scales can overlay
v1.3 [Mar 2, 2012]
-When double-clicking on trace files, all traces now open in the same instance of Line Sweep Tools
-Users can set the colors of the background, text, and traces
-Users can select black and white, or color, while printing