Match! is a program for phase identification using powder diffraction data. It compares the diffraction pattern of your sample to a database containing reference patterns in order to identify the phases which are present. You can also perform qualitative analysis and quantitative analysis (using Rietveld refinement).
You can easily setup and run Rietveld refinements from within Match!, with the actual calculations being performed automatically, using the program FullProf in the background.
v2.4 [Mar 31, 2015]
Several bugs have been fixed:
- A bug causing incorrect (too low) counts and amount (%) values of individual phases in the "Calculate profile integrals" dialog has been fixed. The problem became apparent if at least one of the selected entries/phases contained peaks only in a narrow 2theta range or only up to low 2theta values.
- Double-clicking on a diffraction data file on Windows opened the Match! program, but the diffraction data file was not imported.
- The code for the import of 2-column raw data files (either "2theta intensity" or "d-value intensity") contained a bug that caused a smoothing of the raw data in certain circumstances.
- If you load a document that has been created using a different reference database than the one that you currently using, the following "Restraints" and "Additional entries" criteria are now reset automatically: entry number, original entry number, quality marks and subfiles.
- A couple of minor issues has been fixed as well.
