Multi-instrument is a suite of tools that includes an oscilloscope, a signal generator, a multimeter and a spectrum analyzer. The product is intended for professional use and, as such, it requires using special hardware, except for the oscilloscope, which can get data directly from your computer’s sound card. The built-in tools can perform various types of analysis in the domains of time, frequency and time-frequency.
The program has the kind of interface that characterizes technical software. It is filled with lots of buttons, menu commands and options, which makes it quite difficult to use by non-experts. Luckily, it comes with an excellent help file and even a user manual. Depending on the instrument, there are different panels that graphically show the values being captured. Luckily, these panels can be manipulated on the working region so that some of them are visible at the same time. Once you have arranged them, it is a good idea to save the layout as default for future usage.
Again, according the instrument, the data are visible as waveforms that you can calibrate to meet your specific requirements. Similarly, the input can also be processed using various statistical procedures to calculate the maximum value, minimum value, mean value and root mean square value. Finally, it is good that the program supports those tests that require integrating data from various loggers. In this regard, it allows merging and extracting data from various sources.
The product has so many features that it is practically impossible to review all of them. Just an example, the digital oscilloscope includes a transient recorder, a data recorder, a voltmeter, various digital filters, a persistence module and an AM-FM-PM demodulator. It also allows generating Lissajous plots and taking equivalent time samples.
To conclude, there is no doubt that Multi-instrument may come in handy for various types of experiments and procedures that require acquiring and analyzing data from different sources. The product is available in different editions (Lite, Standard and Pro) with prices that range from $24.95 for the SC Oscilloscope to $499.00 for the full package. Besides, there are add-on modules, such as a 3D plotter, a data logger and a vibrometer, which may be purchased separately. Fortunately, you can try all the features available from the Pro edition using some sample files at no cost.
v3.4 [Dec 8, 2014]
- Added "WaveFile" option in waveform selection box on Signal Generator panel to allow wave file replay through signal generator under streaming mode. It is able to convert the sampling rate and bit resolution of the wave file automatically if they are different from those of the Signal Generator. Also, it allows the selection of sampling channels if the number of channel supported by the DAC hardware is different than that of the wave file.
- Added IPT instruction in Device Test Plan to allow user input such as the input from a barcode scanner. The texts input from the user is stored in a DDP called UserInput.
- Added SEL instruction in Device Test Plan to allow user selection between two options.
- Added User Log In/Off control in Device Test Plan. The user nametext is stored in a DDP called UserName.
- Added a DDP called TestResult in Device Test Plan to summarize the test result: PASS/FAIL/DONE.
- Added 5 volatile and 5 non-volatile integer variables as well as a Reset button for non-volatile integer variables in Device Test Plan.
- Added OPT instruction to perform mathematical operation, ,-,*,/, on these 10 variables in Device Test Plan.
- Added CLR instruction in Device Test Plan to clear the intermediate test results in Process Viewer or Device Test Plan Log. For the latter one, an option is provided to store the texts into a file before clearing them.
- The Result Window of Device Test Plan is expanded to the right at runtime. It is split into four display areas with three of them programmable.
- Added a comprehensive set of special formatting characters in the description of LOG instruction in Device Test Plan so that it can write texts to a file with a fixed name or a name automatically changing with date and time, UserName, UserInput, etc. Header lines and subheader lines are supported. The LOG instruction can also be used to write to the three programmable display areas of the Result window.
- The execution of some instructions in Device Test Plan are sped up such as LOG, JMP and CHK.
- Added Step Label function in Device Test Plan. It will move up and down automatically with its associated step while deleting or inserting a step.
- You can manually mark a failed step in Device Test Plan as PASS based on your own judgement.
- You can manually select a step in Device Test Plan and choose to start from there.
- Added a context menu in the Process Viewer of Device Test Plan.
- Added a user configurable timeout setting for SIO and STI instructions in Device Test Plan.
- Improved the duration accuracy of OUT instruction in Device Test Plan.
